Dr. Zhonghou Cai [Argonne National Laboratory, USA]
Title: X-ray Micro/nanodiffracton and Application
Time: 9:45 - 10:30 AM, July 8, 2015, Wednesday
Place: HPSTAR seminar room, 3rd floor, Building Dongrong, HPSTAR (Changchun)
Host: Dr. Haozhe Liu
Abstract
Utilizing synchrotron radiation of high brilliance and advanced focusing optics, X-ray microdiffraction has pushed its spatial resolution to a level that covers fundamental length scales in structure and dynamics of various material systems. It combines X-ray micro/nanofocusing capability with x-ray’s high sensitivity in chemical element and crystallographic structure to study spatially resolved elemental content, microstructure, crystallographic phase, lattice strain, and collective electronic state. In this talk I will present the development of the X-ray microscopy techniques at the Advanced Photon Source and their applications.
Brief Bio of Speaker
Dr. Zhonghou Cai is Physicist at X-ray Science Division, Argonne National Laboratory since 1999. His Ph. D was granted in University of Chicago in 1991, and he has published over 190 peer-reviewed papers. He is the winner of R&D 100 in 2000, Director’s Award of Argonne National Laboratory (ANL) in 1999, and Pacesetter Award of ANL in 1999 & 2003.